메뉴 건너뛰기




Volumn 43, Issue 4, 1995, Pages 721-729

Millimeter-Wave On-Wafer Waveform and Network Measurements Using Active Probes

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; ELECTRIC NETWORK PARAMETERS; ELECTRIC NETWORK SYNTHESIS; MILLIMETER WAVE DEVICES; PROBES; SEMICONDUCTING GALLIUM ARSENIDE; TRANSMISSION LINE THEORY; WAVEFORM ANALYSIS; WAVEGUIDES;

EID: 0029289167     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.375217     Document Type: Article
Times cited : (36)

References (25)
  • 1
    • 84937646978 scopus 로고
    • DC and RF performance of 0.1 μm gate length AlInAs-GaInAs pseudo-morphic HEMT's
    • San Francisco, CA Dec. 4–11
    • U. K. Mishra, A. S. Brown, and S. E. Rosenbaum, “DC and RF performance of 0.1 μm gate length AlInAs-GaInAs pseudo-morphic HEMT's,” in Tech. Dig. Int. Electron Dev. Mtg., San Francisco, CA, Dec. 4–11, 1988.
    • (1988) Tech. Dig. Int. Electron Dev. Mtg.
    • Mishra, U.K.1    Brown, A.S.2    Rosenbaum, S.E.3
  • 3
    • 0014631341 scopus 로고
    • Physical modeling of the step recovery diode for pulse and harmonic generation circuits
    • July
    • J. L. Moll and S. A. Hamilton, “Physical modeling of the step recovery diode for pulse and harmonic generation circuits,” Proc. IEEE., vol. 57, pp. 1250–1269, July 1969.
    • (1969) Proc. IEEE. , vol.57 , pp. 1250-1269
    • Moll, J.L.1    Hamilton, S.A.2
  • 4
    • 0015300032 scopus 로고
    • Broad-band thin-film signal sampling circuit
    • Feb.
    • J. Merkelo and R. D. Hall, “Broad-band thin-film signal sampling circuit,” IEEE J. Solid-State Circ., vol. SC-7, pp. 50–54, Feb. 1972.
    • (1972) IEEE J. Solid-State Circ. , vol.SC-7 , pp. 50-54
    • Merkelo, J.1    Hall, R.D.2
  • 5
    • 23144435676 scopus 로고
    • Microwave sampling effective for ultra-broadband frequency conversion
    • Feb.
    • S. E. Moore, B. E. Gilchrist, and J. G. Galli, “Microwave sampling effective for ultra-broadband frequency conversion,” Microwave Syst. News, pp. 113–120, Feb. 1986.
    • (1986) Microwave Syst. News , pp. 113-120
    • Moore, S.E.1    Gilchrist, B.E.2    Galli, J.G.3
  • 7
    • 0025401985 scopus 로고
    • A dual six-port automatic network analyzer incorporating a biphase-bimodulation element
    • Mar.
    • S. R. Judah and A. S. Wright, “A dual six-port automatic network analyzer incorporating a biphase-bimodulation element,” IEEE Trans. Microwave Theory Tech., vol. 38, Mar. 1990.
    • (1990) IEEE Trans. Microwave Theory Tech. , vol.38
    • Judah, S.R.1    Wright, A.S.2
  • 9
    • 0027879763 scopus 로고
    • 4 THz sidewalletched varactors for sub-mm-wave sampling circuits
    • San Jose, CA Oct. 10–13
    • S. T. Allen, U. Bhattacharya, and M. J. W. Rodwell, “4 THz sidewalletched varactors for sub-mm-wave sampling circuits,” in Tech. Dig., GaAs IC Symp., San Jose, CA, Oct. 10–13, 1993.
    • (1993) Tech. Dig., GaAs IC Symp.
    • Allen, S.T.1    Bhattacharya, U.2    Rodwell, M.J.W.3
  • 13
    • 0027568681 scopus 로고
    • 500 GHz MMIC sampling wafer probe
    • Mar. 18
    • M. S. Shakouri, A. Black, B. A. Auld, and D. M. Bloom, “500 GHz MMIC sampling wafer probe,” Electron. Lett., vol. 29, no. 6, pp. 557–558, Mar. 18, 1993.
    • (1993) Electron. Lett. , vol.29 , Issue.6 , pp. 557-558
    • Shakouri, M.S.1    Black, A.2    Auld, B.A.3    Bloom, D.M.4
  • 15
    • 0020865205 scopus 로고
    • Integrated-circuit antennas
    • K. J. Button, Ed. New York: Academic
    • D. B. Rutledge, D. P. Neikirk, and D. P. Kasilingam, “Integrated-circuit antennas,” in Infrared and Millimeter Waves, vol. 10, K. J. Button, Ed. New York: Academic, 1984, pp. 1–90.
    • (1984) Infrared and Millimeter Waves , vol.10 , pp. 1-90
    • Rutledge, D.B.1    Neikirk, D.P.2    Kasilingam, D.P.3
  • 16
    • 0016332045 scopus 로고
    • Lumped elements in microwave integrated circuits
    • L. Young and H. Sobol, Eds. New York: Academic
    • M. Caulton, “Lumped elements in microwave integrated circuits,” in Advances in Microwaves, L. Young and H. Sobol, Eds. New York: Academic, 1974, pp. 143–167.
    • (1974) Advances in Microwaves , pp. 143-167
    • Caulton, M.1
  • 18
    • 0024177728 scopus 로고
    • Thru-match-reflect: one result of a rigorous theory for de-embedding and network analyzer calibration
    • Stockholm, Sweden
    • H. J. Eul and B. Schiek, “Thru-match-reflect: one result of a rigorous theory for de-embedding and network analyzer calibration,” in Proc. 18th Eur. Microwave Conf., Stockholm, Sweden, 1988.
    • (1988) Proc. 18th Eur. Microwave Conf.
    • Eul, H.J.1    Schiek, B.2
  • 25
    • 85063494288 scopus 로고
    • On-wafer single contact S-parameter measurements to 75 GHz: calibration and measurement system
    • Madrid, Spain
    • P. J. Tasker, M. Schlechtweg, and J. Braunstein, “On-wafer single contact S-parameter measurements to 75 GHz: calibration and measurement system,” in 23rd European Microwave Conf., Madrid, Spain, 1993.
    • (1993) 23rd European Microwave Conf.
    • Tasker, P.J.1    Schlechtweg, M.2    Braunstein, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.