Performance and Reliability of NIST 10-V Josephson Arrays

IEEE Transactions on Instrumentation and Measurement

Volumn 44, Issue 2, 1995, Pages 238-240

  Hamilton, C A ^a   Burroughs, C J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON DEVICE MANUFACTURE; FAILURE ANALYSIS; NIOBIUM COMPOUNDS; PERFORMANCE; RELIABILITY; STANDARDS; STATISTICAL METHODS;

JOSEPHSON ARRAYS;

JOSEPHSON JUNCTION DEVICES;

EID: 0029288150     PISSN: 00189456     EISSN: 15579662     Source Type: Journal    
DOI: 10.1109/19.377820     Document Type: Article

References (6)

1. F. L. Lloyd, C. A. Hamilton, J. A. Beall, D. Go, R. H. Ono, and R. E. Harris, “A Josephson array voltage standard at 10 V,” IEEE Electron. Dev. Lett., vol. EDL-8, pp. 449–450, Oct. 1987.
2. R. Popel, J. Niemeyer, R. Fromknecht, W. Meier, and L. Grimm, “1-V and 10-V series array Josephson voltage standards in Nb/Al2O3/Nb technology,” J. Appl. Phys., vol. 68, pp. 4294–4303, Oct. 1990.
3. S. I. Park, K.-T. Kim, Y. Ho Lee, and R. D. Lee, “Development of Nb/Al-oxide/Nb Josephson junction array at KRISS,” IEEE Trans. Instrum. Meas., vol. 42, pp. 588–592, Apr. 1993.
4. M. Gurvitch, M. A. Washington, and H. A. Huggins, “High quality refractory Josephson tunnel junctions utilizing thin Al layers,” Appl. Phys. Lett., vol. 42, pp. 472–474, Mar. 1983.
5. C. A. Hamilton C. Burroughs, and K. Chieh, “Operation of NIST Josephson array voltage standards,” J. Res. Nat. Inst. Stand. Technol., vol. 95, pp. 219–235, May 1990.
6. B. Moore, Redstone Arsenal, private communication.