Generalized matrix method for analysis of coherent and incoherent reflectance and transmittance of multilayer structures with rough surfaces, interfaces, and finite substrates

Applied Optics

Volumn 34, Issue 10, 1995, Pages 1678-1683

  Mitsas, C L ^a   Siapkas, D I ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Multilayer thin films

Indexed keywords

MATHEMATICAL MODELS; MATRIX ALGEBRA; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; THIN FILMS;

COHERENT REFLECTANCE; GENERALIZED MATRIX METHOD; INCOHERENT REFLECTANCE; ROUGH SURFACES;

SURFACE PROPERTIES;

EID: 0029288038     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.001678     Document Type: Article

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