Optoelectronic characterization by photothermal deflection: Single-crystalline semiconductors

Journal of Applied Physics

Volumn 77, Issue 6, 1995, Pages 2767-2772

  Grunow, P ^a   Kunst, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL EQUATIONS; ELECTRIC FIELD EFFECTS; ELECTRONIC PROPERTIES; LASER BEAMS; LIGHT ABSORPTION; MATHEMATICAL MODELS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING SILICON; SINGLE CRYSTALS; THERMAL DIFFUSION; THICKNESS MEASUREMENT;

CADMIUM SULFIDE; DEFLECTION SIGNAL MEASUREMENT; EXCESS CARRIER DECAY; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; SURFACE RECOMBINATION;

ABSORPTION SPECTROSCOPY;

EID: 0029277542     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.358746     Document Type: Article

References (15)

1. Landolt-Börnstein
2. Landolt-Börnstein