Analytic expressions for emission characteristics as a function of experimental parameters in sharp field emitter devices

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 13, Issue 2, 1995, Pages 511-515

  Jensen, K L ^a   Zaidman, E G ^a  

^a ESTD ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; APPROXIMATION THEORY; DIODES; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRODES; ELECTRON EMISSION; ERRORS; FIELD EMISSION CATHODES; GEOMETRY; MATHEMATICAL MODELS; TRIODES;

DIODE GEOMETRY; ELLIPTICAL FIELD EMITTING STRUCTURES; IMAGE CHARGE EFFECTS; ONE DIMENSIONAL ANALYSIS; SHARP FIELD EMITTER DEVICES;

SEMICONDUCTOR DEVICES;

EID: 0029275693     PISSN: 0734211X     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588344     Document Type: Article

References (13)