|
Volumn 18, Issue 1, 1995, Pages 39-47
|
Analysis of Thermal Transient Data with Synthesized Dynamic Models for Semiconductor Devices
a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CALCULATIONS;
ELECTRONICS PACKAGING;
HEAT RESISTANCE;
SEMICONDUCTOR DEVICE MODELS;
TEMPERATURE MEASUREMENT;
THERMOANALYSIS;
CYCLIC DEVICE POWERING CONDITIONS;
JUNCTION TO AMBIENT THERMAL RESISTANCE;
JUNCTION TO CASE THERMAL STEP RESPONSES;
SYNTHESIZED DYNAMIC MODELS;
THERMAL CAPACITANCES;
THERMAL IMPEDANCE;
THERMAL TRANSIENT DATA;
SEMICONDUCTOR DEVICE MANUFACTURE;
|
EID: 0029275470
PISSN: 10709886
EISSN: None
Source Type: Journal
DOI: 10.1109/95.370733 Document Type: Article |
Times cited : (123)
|
References (4)
|