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Volumn 18, Issue 1, 1995, Pages 39-47

Analysis of Thermal Transient Data with Synthesized Dynamic Models for Semiconductor Devices

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRONICS PACKAGING; HEAT RESISTANCE; SEMICONDUCTOR DEVICE MODELS; TEMPERATURE MEASUREMENT; THERMOANALYSIS;

EID: 0029275470     PISSN: 10709886     EISSN: None     Source Type: Journal    
DOI: 10.1109/95.370733     Document Type: Article
Times cited : (123)

References (4)
  • 2
    • 84946968218 scopus 로고
    • Circuit-performance and thermal resistance measurments
    • Feb.
    • “Circuit-performance and thermal resistance measurments” (3100 Series) MIL-STD-750C, Feb. 1993.
    • (1993) (3100 Series) MIL-STD-750C
  • 3
    • 84946964435 scopus 로고
    • Modern Control Engineering
    • Englewood Cliffs, NJ: Prentice-Hall,
    • K. Ogata, Modern Control Engineering. Englewood Cliffs, NJ: Prentice-Hall, 1968, ch. 4.
    • (1968) ch. 4
    • Ogata, K.1
  • 4
    • 84946965045 scopus 로고    scopus 로고
    • Stearns
    • ch. 11. Rochelle Park, NJ: Hayden Book,
    • Samuel D. Stearns, Digital Signal Analysis. Rochelle Park, NJ: Hayden Book, ch. 11.
    • Digital Signal Analysis
    • Samuel, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.