Scaling Constraints Imposed by Self-Heating in Submicron SOI MOSFET's

IEEE Transactions on Electron Devices

Volumn 42, Issue 3, 1995, Pages 489-496

  Dallmann, Douglas A ^a   Shenai, Krishna ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CONSTRAINT THEORY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; HEAT LOSSES; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SILICON ON INSULATOR TECHNOLOGY;

BURIED OXIDE LAYERS; SCALING CONSTRAINTS; SELF HEATING;

MOSFET DEVICES;

EID: 0029274172     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.368045     Document Type: Article

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