Field emission characteristics of diamond coated silicon field emitters

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 13, Issue 2, 1995, Pages 422-426

  Liu, J ^a   Zhirnov, V V ^a   Myers, A F ^a   Wojak, G J ^a   Choi, W B ^a   Hren, J J ^a   Wolter, S D ^a   McClure, M T ^a   Stoner, B R ^a   Glass, J T ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; GRAIN SIZE AND SHAPE; NUCLEATION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING DIAMONDS; SEMICONDUCTING SILICON; SINGLE CRYSTALS; STABILITY;

FIELD EMISSION MICROSCOPY; FIELD ION MICROSCOPY; FOWLER-NORDHEIM ANALYSIS; SILICON FIELD EMITTERS; WORK FUNCTION;

ELECTRON DEVICES;

EID: 0029273039     PISSN: 0734211X     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.587961     Document Type: Article

References (8)