Statistical analysis of field emitter emissivity: application to flat displays

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 13, Issue 2, 1995, Pages 553-557

  Levine, J D ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CURRENT DENSITY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC CURRENTS; MATHEMATICAL MODELS; STATISTICAL METHODS;

FIELD EMITTER ARRAYS; FOWLER-NORDHEIM PLOT; GAUSSIAN DISTRIBUTION; MICROTIP SHARPNESS; WORK FUNCTION;

ELECTRON DEVICES;

EID: 0029273024     PISSN: 0734211X     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588353     Document Type: Article

References (9)