Near-field optical detection of asperities in dielectric surfaces

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 12, Issue 3, 1995, Pages 501-512

  Kann, Joshua L ^a   Milster, Tom D ^a   Froehlich, Fred F ^a   Ziolkowski, Richard W ^a   Judkins, Justin B ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC FIELDS; ELECTROMAGNETISM; FINITE DIFFERENCE METHOD; LIGHT POLARIZATION; MAGNETIC FIELDS; MATHEMATICAL MODELS; OPTICAL SYSTEMS; PROBES;

ANGULAR SPECTRUM; ELECTROMAGNETIC PROBE FIELDS; FINITE DIFFERENCE TIME DOMAIN CODE; NEAR FIELD OPTICAL SYSTEMS; SURFACE ASPERITY; TE POLARIZATION; TM POLARIZATION;

OPTICAL WAVEGUIDES;

EID: 0029271416     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.12.000501     Document Type: Article

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