Simulations and Measurements of Picosecond Signal Transients, Propagation, and Crosstalk on Lossy VLSI Interconnect

IEEE Transactions on Components Packaging and Manufacturing Technology Part A

Volumn 18, Issue 1, 1995, Pages 215-225

  Eo, Yungseon ^a   Eisenstadt, William R ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CATHODE RAY OSCILLOSCOPES; COMPUTER SIMULATION; ELECTRIC VARIABLES MEASUREMENT; FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; INTERCONNECTION NETWORKS; INVERSE PROBLEMS; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS; TRANSFER FUNCTIONS;

ARBITRARY LOADS; INTERCONNECT CIRCUIT PARAMETERS; INTERCONNECT TRANSFER FUNCTION; MULTICONDUCTOR TELEGRAPHERS EQUATION; PICOSECOND SIGNAL TRANSIENTS; SOFTWARE PACKAGE PISCES II; TIME DOMAIN MEASUREMENTS; VLSI INTERCONNECT;

VLSI CIRCUITS;

EID: 0029271355     PISSN: 10709886     EISSN: None     Source Type: Journal    
DOI: 10.1109/95.370758     Document Type: Article

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