The silicalite/p-xylene system : Part I - Flexibility of the MFI framework and sorption mechanism observed during p-xylene pore-filling by X-ray powder diffraction at room temperature

Materials Research Bulletin

Volumn 30, Issue 3, 1995, Pages 373-380

  Mentzen, B F ^a   Gelin, P ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; MOLECULAR PHYSICS; OXYGEN; PHASE TRANSITIONS; POROUS MATERIALS; SILICON COMPOUNDS; SORPTION; TEMPERATURE; X RAY POWDER DIFFRACTION;

MOLECULAR MECHANICS; ROOM TEMPERATURE; SILICALITE;

ZEOLITES;

EID: 0029269580     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/0025-5408(95)00003-8     Document Type: Article

References (26)

1. The location ofp-xylene in a single crystal of zeolite H-ZSM-5 with a new, sorbate-induced, orthorhombic framework symmetry
2. A new computer program for Rietveld analysis of X-ray powder diffraction patterns
3. Molecular Mechanics Studies on MFI Type Zeolites. 1. Effect of p-Xylene Adsorption on the Zeolite Structure
4. On the location and disorder of the tetrapropylammonium (TPA) ion in zeolite ZSM-5 with improved framework accuracy
5. High-temperature (350 K) orthorhombic framework structure of zeolite H-ZSM-5
6. Time-resolved powder diffraction as an analytical tool for diffusion studies in microporous topologies