An AC Conductance Technique for Measuring Self-Heating in SOI MOSFET's

IEEE Electron Device Letters

Volumn 16, Issue 2, 1995, Pages 67-69

  Tu, Robert H ^a   Wann, Clement ^a   King, Joseph C ^a   Ko, Ping K ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; CURVE FITTING; ELECTRIC CONDUCTIVITY; ELECTRIC VARIABLES MEASUREMENT; FREQUENCIES; HEATING; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY; THERMAL EFFECTS;

AC CONDUCTANCE; DRAIN VOLTAGE; PARAMETER EXTRACTION; SELF HEATING EFFECT; SHALLOW JUNCTION;

MOSFET DEVICES;

EID: 0029255981     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.386025     Document Type: Article

References (7)

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