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Volumn 98, Issue 4, 1995, Pages 143-146
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Modified Z-scan method with simplicity and enhanced sensitivity
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION;
ELECTRIC FIELDS;
LIGHT ABSORPTION;
LIGHT REFLECTION;
LIGHT REFRACTION;
LIGHT TRANSMISSION;
NONLINEAR OPTICS;
NUMERICAL ANALYSIS;
OPTICAL PROPERTIES;
CONDENSED MATERIALS;
ENHANCED SENSITIVITY;
GAUSSIAN BEAM;
LASER WAVELENGTH;
TEM MODE;
THERMALLY INDUCED NONLINEARITY;
Z SCAN METHOD;
LASER BEAMS;
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EID: 0029255817
PISSN: 00304026
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (5)
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References (9)
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