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Volumn 78, Issue 2, 1995, Pages 379-387
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Structural Characterization and High‐Temperature Behavior of Silicon Oxycarbide Glasses Prepared from Sol‐Gel Precursors Containing Si‐H Bonds
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
COMPOSITION EFFECTS;
HIGH TEMPERATURE PROPERTIES;
NANOSTRUCTURED MATERIALS;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
PRECIPITATION (CHEMICAL);
RAMAN SPECTROSCOPY;
SILICON COMPOUNDS;
SOL-GELS;
STRUCTURE (COMPOSITION);
THERMAL EFFECTS;
X RAY DIFFRACTION;
SILICON OXYCARBIDE GLASS;
STRUCTURAL REARRANGEMENT;
GLASS;
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EID: 0029255273
PISSN: 00027820
EISSN: 15512916
Source Type: Journal
DOI: 10.1111/j.1151-2916.1995.tb08811.x Document Type: Article |
Times cited : (256)
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References (40)
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