BER Sensitivity of OFDM Systems to Carrier Frequency Offset and Wiener Phase Noise

IEEE Transactions on Communications

Volumn 43, Issue 234, 1995, Pages 191-193

  Pollet, Thierry ^a   Van Bladel, Mark ^a   Moeneclaey, Marc ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

BER degradation; carrier frequency offset; OFDM; Wiener noise

Indexed keywords

AMPLITUDE MODULATION; BIT ERROR RATE; CARRIER COMMUNICATION; COMMUNICATION CHANNELS (INFORMATION THEORY); FAST FOURIER TRANSFORMS; MATHEMATICAL MODELS; PHASE SHIFT KEYING; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO; WHITE NOISE;

ADDITIVE WHITE GAUSSIAN NOISE; BIT ERROR RATE SENSITIVITY; CARRIER FREQUENCY OFFSET; WEINER PHASE NOISE;

FREQUENCY DIVISION MULTIPLEXING;

EID: 0029253863     PISSN: 00906778     EISSN: None     Source Type: Journal    
DOI: 10.1109/26.380034     Document Type: Article

References (6)

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