CMOS chip-set for detecting 10 ppb concentrations of heavy metals

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 38, Issue , 1995, Pages

  Ryan, John G ^a   Barry, Lee ^a   Lyden, Colin ^a   Alderman, John ^a   Lane, Bill ^a   Schiffner, Lutz ^a   Boldt, Jurgen ^a   Thieme, Hermann ^a  

^a UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ELECTRODES; HEAVY METALS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; PH EFFECTS; THERMAL EFFECTS; USER INTERFACES; VOLTAGE CONTROL; WATER POLLUTION; WATER QUALITY;

ANODIC STRIPPING VOLTAMMETRY; COUNTER ELECTRODE; DISPOSABLE DIPSTICK; METALLIC CONTAMINANTS; REFERENCE ELECTRODE; SYSTEM POD;

CMOS INTEGRATED CIRCUITS;

EID: 0029252102     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)