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Volumn 16, Issue 2, 1995, Pages 55-57

Ultrahigh fT and fmax New Self-Alignment InP/InGaAs HWT's with a Highly Be-doped Base Layer Grown by ALE/MOCVD

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; ELECTRIC RESISTANCE; EPITAXIAL GROWTH; GATES (TRANSISTOR); METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERFORMANCE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING;

EID: 0029250794     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.386029     Document Type: Article
Times cited : (26)

References (8)
  • 4
    • 0027816874 scopus 로고
    • High fmax InAlAs/InGaAs heterojunction bipolar transistors
    • H. F. Chau and Y. C. Kao, “High fmax InAlAs/InGaAs heterojunction bipolar transistors,” Proc. IEDM, pp. 783–786, 1993.
    • (1993) Proc. IEDM , pp. 783-786
    • Chau, H.F.1    Kao, Y.C.2
  • 7
    • 0026983635 scopus 로고
    • Parameter-extraction method for heterojunction bipolar transistors
    • S. A. Mass and D. Tait, “Parameter-extraction method for heterojunction bipolar transistors,” IEEE Microwave and Guided Wave Lett., vol. 2, pp. 502–504, 1992.
    • (1992) IEEE Microwave and Guided Wave Lett. , vol.2 , pp. 502-504
    • Mass, S.A.1    Tait, D.2
  • 8
    • 84939361544 scopus 로고
    • Evaluation of the factors determining HBT high frequency performance by direct analysis of S-parameter data
    • D. R. Pehlke and D. Pavlidis, “Evaluation of the factors determining HBT high frequency performance by direct analysis of S-parameter  data,” IEEE Microwave Theory Tech., vol. 40, pp. 2367–2373, 1992.
    • (1992) IEEE Microwave Theory Tech. , vol.40 , pp. 2367-2373
    • Pehlke, D.R.1    Pavlidis, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.