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Volumn 16, Issue 2, 1995, Pages 55-57
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Ultrahigh fT and fmax New Self-Alignment InP/InGaAs HWT's with a Highly Be-doped Base Layer Grown by ALE/MOCVD
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CARRIER CONCENTRATION;
ELECTRIC RESISTANCE;
EPITAXIAL GROWTH;
GATES (TRANSISTOR);
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
PERFORMANCE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE STRUCTURES;
SEMICONDUCTOR DOPING;
BASE COLLECTOR CAPACITANCE;
BASE DOPING CONCENTRATION;
BASE RESISTANCE;
EMITTER;
SELF ALIGNMENT;
HETEROJUNCTION BIPOLAR TRANSISTORS;
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EID: 0029250794
PISSN: 07413106
EISSN: 15580563
Source Type: Journal
DOI: 10.1109/55.386029 Document Type: Article |
Times cited : (26)
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References (8)
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