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Volumn 46, Issue 2, 1995, Pages 181-183

A TiBN film formed by EB-ion plating and N ion bombardment of a TiB film

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AUGER ELECTRON SPECTROSCOPY; DEPOSITION; DIFFUSION; ELECTRON DIFFRACTION; FILM GROWTH; ION BOMBARDMENT; METALLOGRAPHIC MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0029250199     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0042-207X(94)E0036-X     Document Type: Article
Times cited : (11)

References (6)
  • 6
    • 84919230685 scopus 로고    scopus 로고
    • L S Wen, C Z Chen, Q Q Yang and X Z Chen, J Vac Sci Technol, 7, 31 (1987) (in Chinese).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.