Universality of electron mobility curves in MOSFETs: a Monte Carlo study

IEEE Transactions on Electron Devices

Volumn 42, Issue 2, 1995, Pages 258-265

  Gamiz, F ^a   Lopez Villanueva, J A ^a   Banqueri, J ^a   Carceller, J E ^a   Cartujo, P ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC FIELDS; ELECTRONS; IMPURITIES; INTERFACES (MATERIALS); MONTE CARLO METHODS; OXIDES; SILICON;

CHARGED CENTERS; COULOMB SCATTERING; ELECTRON MOBILITY; SILICON BULK;

MOSFET DEVICES;

EID: 0029250038     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.370071     Document Type: Article

References (36)