SuperMAXIMUM: A Schwarzschild-based, spectromicroscope for ELETTRA

Review of Scientific Instruments

Volumn 66, Issue 2, 1995, Pages 2273-2276

  Welnak, J ^a   Dong, Z ^a   Solak, H ^a   Wallace, J ^a   Cerrina, F ^a   Bertolo, M ^b   Bianco, A ^b   Di Fonzo, S ^b   Fontana, S ^b   Jark, W ^b   Mazzolini, F ^b   Rosei, R ^b   Savoia, A ^b   Underwood, J H ^c   Margaritondo, G ^d  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b SINCROTRONE TRIESTE   (Italy)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; DESIGN; DIFFRACTION GRATINGS; DOS; ELECTRON GUNS; FABRICATION; IMAGING SYSTEMS; MECHANICS; MIRRORS; MONOCHROMATORS; SUBROUTINES; UNIX;

CHANNELTRONS; ELECTRON ENERGY ANALYZER; SOFTWARE PACKAGE - LABVIEW; UNDULATORS; X RAY DETECTORS; X RAY SCANNING SPECTROMICROSCOPE;

X RAY MICROSCOPES;

EID: 0029247491     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1145662     Document Type: Article

References (12)