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Volumn 46, Issue 1, 1995, Pages 110-116
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Better models or better algorithms? Techniques to improve fault diagnosis
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
CMOS INTEGRATED CIRCUITS;
COMPUTER AIDED ANALYSIS;
COMPUTER SIMULATION;
ELECTRIC FAULT LOCATION;
ELECTRONICS PACKAGING;
HEURISTIC PROGRAMMING;
MICROPROCESSOR CHIPS;
VLSI CIRCUITS;
BRIDGING;
FAILING TEST VECTORS;
FAULT DIAGNOSIS;
STUCK AT FAULT MODEL;
FAILURE ANALYSIS;
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EID: 0029244675
PISSN: 00181153
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (23)
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References (16)
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