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Volumn 66, Issue 2, 1995, Pages 2232-2234
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Optical metrology facility at the ESRF
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Author keywords
[No Author keywords available]
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Indexed keywords
CLEAN ROOMS;
FITS AND TOLERANCES;
HELIUM NEON LASERS;
HETERODYNING;
INTERFEROMETRY;
MIRRORS;
QUALITY CONTROL;
ROUGHNESS MEASUREMENT;
SENSORS;
THERMODYNAMIC STABILITY;
FRINGE PATTERN;
METROLOGY LABORATORY;
MICROROUGHNESS;
OPTICAL QUALITY;
SHACK HARTMANN SENSOR;
SLOPE ERROR;
X RAY MIRRORS;
X RAY OPTICS;
LABORATORIES;
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EID: 0029244619
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1146506 Document Type: Article |
Times cited : (23)
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References (12)
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