Numerical analysis of a two-dimensional near-field probe

Ultramicroscopy

Volumn 57, Issue 2-3, 1995, Pages 251-256

  Kann, Joshua L ^a   Milster, Tom D ^a   Froehlich, Fred ^a   Ziolkowski, Richard W ^a   Judkins, Justin ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; FINITE DIFFERENCE METHOD; GLASS; MATHEMATICAL MODELS; SUBSTRATES; TIME DOMAIN ANALYSIS;

AMPERE EQUATION; ANGULAR SPECTRUM TECHNIQUE; FARADAY EQUATION; NEAR FIELD OPTICS; NEAR FIELD PROBE;

OPTICAL SYSTEMS;

CONFERENCE PAPER; MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0029239790     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(94)00148-G     Document Type: Article

References (6)

1. Near-field diffraction by a slit: implications for superresolution microscopy