Study of the features of PSTM images by means of a perturbative approach

Ultramicroscopy

Volumn 57, Issue 2-3, 1995, Pages 246-250

  Sentenac, Anne ^a   Greffet, Jean Jacques ^a  

^a LABORATOIRE EM2C   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER OPTICS; IMAGE ANALYSIS; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; PERTURBATION TECHNIQUES;

EVANESCENT WAVE; SUBWAVELENGTH RESOLUTION;

SCANNING TUNNELING MICROSCOPY;

COMPUTER SIMULATION; CONFERENCE PAPER; MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0029239730     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(94)00147-F     Document Type: Article

References (11)

1. Sisyphus cooling of a bound atom
2. Application of Mie Scattering of Evanescent Waves to Scanning Tunnelling Optical Microscopy Theory
3. Analysis of photon scanning tunneling microscope images
4. Diffraction of electromagnetic waves by crossed gratings: a series solution