Structure and concepts for current-based analog scan

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1995, Pages 517-520

  Soma, Mani ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER CIRCUITS; DIGITAL CIRCUITS; INTEGRATED CIRCUIT LAYOUT; LOGIC DESIGN;

CURRENT BASED ANALOG SCAN; DESIGN FOR TESTABILITY;

INTEGRATED CIRCUIT TESTING;

EID: 0029239162     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)