Thin films of semiconducting SnSi alloys grown by pulsed laser deposition

Materials Research Society Symposium - Proceedings

Volumn 358, Issue , 1995, Pages 775-780

  Treece, Randolph E ^a   Horwitz, J S ^a   Chrisey, D B ^a   Tang, J ^a   Williams, R S ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; COMPOSITION; DEPOSITION; ENERGY GAP; FILM GROWTH; PULSED LASER APPLICATIONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR SUPERLATTICES; THICKNESS CONTROL; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC LAYERS; CRYSTALLITES; PULSED LASER DEPOSITION; TIN SILICIDE;

SEMICONDUCTING FILMS;

EID: 0029238578     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)