Soft error immunity of 1-volt CMOS memory cells with MTCMOS technology

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1995, Pages 107-111

  Douseki, Takakuni ^a   Mutoh, Shin'ichiro ^a   Ueki, Takemi ^a   Yamada, Junzo ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; LASERS; LSI CIRCUITS; MOSFET DEVICES; TECHNOLOGY;

CMOS MEMORY CELLS; CURRENT VOLTAGE OPERATION; DECODER; LOW VOLTAGE MEMORY; PULSE LASER TESTER; SOFT ERROR IMMUNITY; TEST CHIP; THRESHOLD VOLTAGE;

CMOS INTEGRATED CIRCUITS;

EID: 0029237716     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)