Multiple measurement approach for feature alignment

IEEE Proceedings of the National Aerospace and Electronics Conference

Volumn 1, Issue , 1995, Pages 94-101

  Kosir, Pete ^a   DeWall, Rob ^a   Mitchell, Richard D ^a  

^a Veda Inc ^*

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; MATRIX ALGEBRA; OBJECT RECOGNITION; PATTERN RECOGNITION SYSTEMS; SPATIAL VARIABLES MEASUREMENT; STATISTICAL METHODS; VECTORS;

COVARIANCE MATRIX; FEATURE ALIGNMENT; MEAN VECTOR; MULTIPLE MEASUREMENT APPROACH; STATISTICAL MODEL;

FEATURE EXTRACTION;

EID: 0029232810     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)