Statistics for matching

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1995, Pages 193-197

  Pergoot, A ^a   Graindourze, B ^a   Janssens, Er ^a   Bastos, J ^a   Steyaert, M ^a   Kinget, P ^a   Roovers, R ^a   Sansen, W ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; RANDOM PROCESSES; STATISTICAL METHODS; STATISTICS;

MATCHING; STANDARD DEVIATION;

SEMICONDUCTOR DEVICE TESTING;

EID: 0029228084     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)