Fluorescence scanning near-field optical microscopy (FSNOM) by measuring the decay time of a fluorescent particle

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2384, Issue , 1995, Pages 90-100

  Barchiesi, Dominique ^a   Pagnot, Thierry ^a   Pieralli, Christian ^a   Van Labeke, Daniel ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; MATHEMATICAL MODELS; NANOTECHNOLOGY; PERTURBATION TECHNIQUES; SURFACE PHENOMENA;

FLUORESCENCE LIFETIME; FLUORESCENCE SCANNING MICROSCOPY; NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0029225096     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)