Building-in ESD/EOS reliability for sub-halfmicron CMOS processes

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1995, Pages 276-283

  Diaz, Carlos H ^a   Kopley, Thomas E ^a   Marcoux, Paul J ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DEGRADATION; ELECTRIC DISCHARGES; ELECTROSTATICS; HOT CARRIERS; MOSFET DEVICES; PERFORMANCE; RELIABILITY; SEMICONDUCTOR DEVICE MANUFACTURE;

BUILD IN RELIABILITY; ELECTRICAL OVERSTRESS; ELECTROSTATIC DISCHARGE; HOT CARRIER DEGRADATION;

CMOS INTEGRATED CIRCUITS;

EID: 0029223662     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1995.363709     Document Type: Conference Paper

References (13)