Approach to dynamic power consumption current testing of CMOS ICs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1995, Pages 95-100

  Segura, J A ^a   Roca, M ^a   Mateo, D ^a   Rubio, A ^a  

^a UNIVERSITAT DE LES ILLES BALEARS   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC POWER CONSUMPTION CURRENT TESTING; STATIC POWER CONSUMPTION;

BOOLEAN FUNCTIONS; CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC POWER UTILIZATION; HETEROJUNCTIONS; LOGIC CIRCUITS; SENSORS;

INTEGRATED CIRCUIT TESTING;

EID: 0029222603     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)