Comparison of the beveled-edge and reach-through APD structures for PET applications

IEEE Nuclear Science Symposium & Medical Imaging Conference

Volumn 4, Issue , 1995, Pages 1864-1868

  Paulus, Michael J ^a   Rochelle, James M ^a   Binkley, David M ^a  

^a CTI PET Systems Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRIC PROPERTIES; NUMERICAL ANALYSIS; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE;

BEVELED EDGE STRUCTURE; GALLIUM DIFFUSION; NOISE FACTOR; REACH THROUGH STRUCTURE; TIMING RESOLUTION;

POSITRON EMISSION TOMOGRAPHY;

EID: 0029216875     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)