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Volumn 3, Issue , 1995, Pages 2000-2002
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Entropy based classification scheme for polarimetric SAR data
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Author keywords
[No Author keywords available]
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Indexed keywords
EIGENVALUES AND EIGENFUNCTIONS;
ELECTROMAGNETIC WAVE SCATTERING;
MATRIX ALGEBRA;
POLARIMETERS;
RADAR IMAGING;
REFLECTION;
SYNTHETIC APERTURE RADAR;
EIGENVECTOR ANALYSIS;
FACTORIZATION;
GEOPHYSICAL FEATURES;
NATURAL TERRAIN;
REFLECTION SYMMETRY;
SCATTERING ENTROPY;
DATA PROCESSING;
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EID: 0029215163
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (21)
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References (3)
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