Model-based matching of line drawings by linear combinations of prototypes

IEEE International Conference on Computer Vision

Volumn , Issue , 1995, Pages 531-536

  Jones, Michael J ^a   Poggio, Tomaso ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; COMPUTER VISION; ERRORS; LEARNING SYSTEMS; OPTIMIZATION;

LINE DRAWINGS; MODEL BASED MATCHING; PIXELWISE CORRESPONDENCES; PROTOTYPES;

OBJECT RECOGNITION;

EID: 0029215135     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)