Growth and structure of Al/MgO interfaces

Materials Research Society Symposium - Proceedings

Volumn 357, Issue , 1995, Pages 41-46

  Wagner, T ^a   Ruehle, M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; FILM GROWTH; MAGNESIA; METALLIC FILMS; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ALUMINUM/MAGNESIUM OXIDE INTERFACES;

INTERFACES (MATERIALS);

EID: 0029215005     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)