Characterization and electrical properties of doped PZT thin films prepared by sol-gel processing

Materials Research Society Symposium - Proceedings

Volumn 361, Issue , 1995, Pages 421-426

  Lee, Wan In ^a   Lee, J K ^a   Chung, Ilsub ^a   Chung, C W ^a   Yoo, I K ^a   Desu, Seshu B ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; DOPING (ADDITIVES); FERROELECTRICITY; GRAIN SIZE AND SHAPE; LEAD COMPOUNDS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LEAD ZIRCONATE TITANATE;

FERROELECTRIC MATERIALS;

EID: 0029213941     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)