Rapid diagnostic fault simulation of stuck-at faults in sequential circuits using compact lists

Proceedings - Design Automation Conference

Volumn , Issue , 1995, Pages 133-138

  Venkataraman, Srikanth ^a   Hartanto, Ismed ^a   Fuchs, W Kent ^a   Rudnick, Elizabeth M ^a   Chakravarty, Sreejit ^a   Patel, Janak H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC FAULT LOCATION; MATHEMATICAL MODELS; MATRIX ALGEBRA; VECTORS;

COMPACT LISTS; DIAGNOSTIC EXPECTATION; DIAGNOSTIC POWER; DIAGNOSTIC RESOLUTION; DIAGNOSTIC TEST VECTORS; FAULT EQUIVALENCE CLASSES; RAPID DIAGNOSTIC FAULT SIMULATION; STUCK AT FAULTS; TIME COMPLEXITY;

SEQUENTIAL CIRCUITS;

EID: 0029213356     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/217474.217519     Document Type: Conference Paper

References (10)