Asynchronous multiple scan chains

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1995, Pages 270-276

  Narayanan, Sridhar ^a   Breuer, Melvin A ^a  

^a SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASYNCHRONOUS MULTIPLE SCAN CHAINS; CONTROL COMPLEXITY; CONTROL SIGNALS; FINITE STATE MACHINES; SCAN FLIP FLOPS;

CONTROL; FINITE AUTOMATA; FLIP FLOP CIRCUITS; FREQUENCIES; LOGIC DESIGN; NUMERICAL METHODS;

INTEGRATED CIRCUIT TESTING;

EID: 0029212404     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)