Fully integrated nonlinear modeling and characterization system of microwave transistors with on-wafer pulsed measurements

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1995, Pages 1033-1036

  Teyssier, J P ^a   Viaud, J P ^a   Raoux, J J ^a   Quere, R ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DATABASE SYSTEMS; ELECTRIC VARIABLES MEASUREMENT; EQUIVALENT CIRCUITS; HIGH ELECTRON MOBILITY TRANSISTORS; MATHEMATICAL MODELS; MESFET DEVICES; MICROWAVE DEVICES; NONLINEAR EQUATIONS; OPTIMIZATION; TABLE LOOKUP;

FULLY INTEGRATED NONLINEAR MODELING; MICROWAVE TRANSISTORS; ON WAFER PULSED MEASUREMENT; S PARAMETER;

TRANSISTORS;

EID: 0029209839     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)