A BIST Scheme for a SNR, Gain Tracking, and Frequency Response Test of a Sigma-Delta ADC

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 42, Issue 1, 1995, Pages 1-15

  Toner, Michael F ^a   Roberts, Gordon W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; FREQUENCY RESPONSE; INTEGRATED CIRCUIT MANUFACTURE; PROGRAM DIAGNOSTICS; SIGNAL TO NOISE RATIO; VLSI CIRCUITS;

GAIN TRACKING TEST; MIXED ANALOG DIGITAL BUILT IN SELF TEST (MADBIST); MIXED SIGNAL INTEGRATED CIRCUITS;

ANALOG TO DIGITAL CONVERSION;

EID: 0029209323     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.363546     Document Type: Article

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