Out-of-control pattern recognition and analysis for quality control charts using LISP-based systems

Computers and Industrial Engineering

Volumn 28, Issue 1, 1995, Pages 81-91

  Swift, Jill A ^a   Mize, Joe H ^b  

^a UNIVERSITY OF MIAMI   (United States)

^b OKLAHOMA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; DECISION MAKING; EXPERT SYSTEMS; GRAPHIC METHODS; INFERENCE ENGINES; LISP (PROGRAMMING LANGUAGE); PATTERN RECOGNITION; STATISTICAL METHODS; STATISTICAL PROCESS CONTROL; USER INTERFACES;

PATTERNS OF VARIATION; QUALITY CONTROL CHARTS;

QUALITY CONTROL;

EID: 0029207414     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/0360-8352(94)00028-L     Document Type: Article

References (5)

1. The application of expert systems to manufacturing process control
2. A framework for expert system development in statistical quality control