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Volumn 389, Issue , 1995, Pages 29-34
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Site balance models in plasma processing: A comparison to molecular dynamics simulations
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Author keywords
[No Author keywords available]
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Indexed keywords
CHLORINATION;
CHLORINE;
MATHEMATICAL MODELS;
MOLECULAR DYNAMICS;
REACTIVE ION ETCHING;
SEMICONDUCTING SILICON;
SURFACE TREATMENT;
ION ASSISTED ETCHING;
SITE BALANCE MODELS;
PLASMA ETCHING;
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EID: 0029201487
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-389-29 Document Type: Conference Paper |
Times cited : (1)
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References (8)
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