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Volumn , Issue , 1995, Pages 13-18

Surface modification tools in a virtual environment interface to a scanning probe microscope

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON MICROSCOPES; INTERACTIVE COMPUTER GRAPHICS; REMOTE CONTROL; SCANNING TUNNELING MICROSCOPY; VIRTUAL REALITY; VISUALIZATION;

EID: 0029201476     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (27)

References (10)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.