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Volumn , Issue , 1995, Pages 13-18
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Surface modification tools in a virtual environment interface to a scanning probe microscope
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRON MICROSCOPES;
INTERACTIVE COMPUTER GRAPHICS;
REMOTE CONTROL;
SCANNING TUNNELING MICROSCOPY;
VIRTUAL REALITY;
VISUALIZATION;
NANOMANIPULATOR SYSTEM;
SCANNING PROBE MICROSCOPE;
SURFACE MODIFICATION TOOLS;
TELEOPERATION;
TELEPRESENCE;
GRAPHICAL USER INTERFACES;
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EID: 0029201476
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (27)
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References (10)
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