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Volumn 2, Issue , 1995, Pages 889-892

Equivalence of physical optics and aperture field integration method in the full pattern analysis - effects of integration surface

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTROMAGNETIC FIELD THEORY; FORECASTING; GEOMETRICAL OPTICS; MAGNETIC FIELDS; NUMERICAL METHODS; SURFACES;

EID: 0029194154     PISSN: 02724693     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (6)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.