256 x 256 CMOS active pixel image sensor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2415, Issue , 1995, Pages 265-275

  Eid, El Sayed I ^a   Dickinson, Alex G ^a   Inglis, Dave A ^a   Ackland, Brian D ^a   Fossum, Eric R ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CMOS INTEGRATED CIRCUITS; ELECTRIC PROPERTIES; FABRICATION; MONOLITHIC INTEGRATED CIRCUITS;

CORRELATED DOUBLE SAMPLING PROCESSORS; ELECTRONIC PANNING APPLICATIONS; FIXED PATTERN NOISE; PIXEL SIZE; READ OUT NODE CAPACITANCE; READ OUT SENSITIVITY;

IMAGE SENSORS;

EID: 0029193049     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.206522     Document Type: Conference Paper

References (3)