Framework for reliability modeling of electronics

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1995, Pages 144-151

  Evans, John ^a   Lall, Pradeep ^a   Bauernschub, Richard ^a  

^a NASA HEADQUARTERS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION; COMPUTER SIMULATION; COMPUTER SOFTWARE; ELECTRONICS PACKAGING; FAILURE ANALYSIS; LOADS (FORCES); MECHANICAL TESTING; MICROPROCESSOR CHIPS; MULTICHIP MODULES; PRODUCT DESIGN; SAFETY FACTOR; STRESSES;

ACCELERATED TESTING; DERATING; FAILURE MECHANISMS; PHYSICS OF FAILURE; RELIABILITY MODELING;

RELIABILITY;

EID: 0029185128     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)