Calculation of the power spectral density from surface profile data

Applied Optics

Volumn 34, Issue 1, 1995, Pages 201-208

  Elson, J Merle ^a   Bennett, Jean M ^a,b  

^a NAVAL AIR WARFARE CENTER   (United States)

^b MOUNT HOLYOKE COLLEGE   (United States)

Author keywords

Beryllium; Power spectral density; Surface profiles

Indexed keywords

BERYLLIUM; CURVE FITTING; DENSITY MEASUREMENT (OPTICAL); FAST FOURIER TRANSFORMS; FREQUENCIES; GRAPHIC METHODS; LIGHT SCATTERING; OPTICAL PROPERTIES; SPECTRUM ANALYSIS; SURFACE MEASUREMENT; SURFACE ROUGHNESS; SURFACES;

ONE DIMENSIONAL; POWER SPECTRAL DENSITY; SURFACE PROFILE DATA; SURFACE PROFILES; SURFACE TEXTURE; TWO DIMENSIONAL;

DENSITY (OPTICAL);

EID: 0029184354     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.000201     Document Type: Article

References (10)

1. "Optics and optical instruments-indications in optical drawings," in Draft International Standard ISO 10110 Part 8: Surface Texture (International Organization for Standardization, ISO/TC 172/SC l/WG 2, Geneva, Switzerland).
2. J. M. Bennett and L. Mattsson, Introduction to Surface Roughness and Scattering (Optical Society of America, Washington, D C., 1989), pp. 28-29, 44-50.
3. E. L. Church and P. Z. Takacs, "The optimal estimation of finish parameters," in Optical Scatter: Applications, Measurement, and Theory, J. C. Stover, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1530, 71-78(1991).
4. E. L. Church, H. A. Jenkinson, and J. M. Zavada, "Relationship between surface scattering and microtopographic features," Opt. Eng. 18, 125-136(1979).
5. J. M. Elson and J. M. Bennett, "Relation between the angular dependence of scattering and the statistical properties of optical surfaces," J. Opt. Soc. Am. 69, 31-47 (1979).
6. J. M. Elson, J. M. Bennett, and J. C. Stover, "Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment," Appl. Opt. 32, 3362-3376 (1993); see also references by Church et al. in this reference.
7. S. L. Marple, Digital Spectral Analysis with Applications (Prentice-Hall, Englewood Cliffs, N.J., 1987), pp. 152-158.
8. W. H. Press, S. A. Teukolsky, W. T. Vettering, and B. P. Flannery, Numerical Recipes in Fortran, The Art of Scientific Computing, 2nd ed. (Cambridge U. Press, New York, 1992), pp. 543-551.
9. J. S. Bendat and A. G. Piersol, Random Data: Analysis and Measurement Procedures (Wiley-Interscience, New York, 1971), pp. 322-330.
10. For example, a commercial algorithm in W. H. Press, S. A. Teukolsky, W. T. Vettering, and B. P. Flannery, Numerical Recipes in Fortran, The Art of Scientific Computing, 2nd ed. (Cambridge U. Press, New York, 1992), pp. 543-551. called SPCTRM.FOR yields smoothed PSD estimates that are one sided.