Testing of uncustomized segmented channel field programmable gate arrays

ACM/SIGDA International Symposium on Field Programmable Gate Arrays - FPGA

Volumn , Issue , 1995, Pages 125-131

  Liu, Tong ^a   Huang, Wei Kang ^a   Lombardi, Fabrizio ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT LAYOUT; LOGIC DESIGN; MANUFACTURE; TRANSISTORS;

CONSTANT TESTABILITY; FIELD PROGRAMMABLE GATE ARRAYS; ITERATIVE LOGIC ARRAYS; TEST VECTORS;

LOGIC CIRCUITS;

EID: 0029179301     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/201310.201330     Document Type: Conference Paper

References (17)